RESISTIVITY OF SEMICONDUCTORS BY FOUR PROBE METHOD AT DIFFERENT TEMPERATURES & DETERMINATION OF BANDGAP – GUPTA BRAND 200220

Features :The experiment consists of the following accessories for four probe arrangement, oven (upto 200oC), Germanium crystal mounted, Thermometer (0-200oC), four probe setup, constant current power supply, digital electronic millivoltmeter of range 200 mV. Display 31/2 digit 7 segment LED

SCR CHARACTERISTICS APPARATUS WITH REGULATED POWER SUPPLY – GUPTA BRAND 200221

Objective :To plot Anode current Vs Anode Cathode Voltage Characteristics. Gate Characteristics (Open Gate), Gate Characteristics (Gate connected).
Features :Instrument comprises of two DC Regulated Power Supplies 0-30VDC/150mA & 0-1VDC/150mA, three round meters for voltage & current measurement, SCR 2P4M mounted behind the panel, connections of Supplies, Meters & SCR brought out at 4mm Sockets

STUDY OF LR CIRCUIT WITH A SOURCE OF ALTERNATING E.M.F – GUPTA BRAND 200260

Objective : a) The power factor, cos Ø of the inductive load.
b) The equivalent power loss resistance of the inductor.
c) Inductance of the inductor.
d) Phase difference between applied voltage & that across resistance.
Features : Instrument comprises of AC power supply, three voltmeter & one milliammeter to measure voltage & current. Inductor, resistance & important connections are brought out on 4 mm. sockets